REDEFINITION OF THE INTERNATIONAL SPHEROID 1930GAUR VK.1980; PROC. INDIAN ACAD. SCI., EARTH PLANET. SCI.; ISSN 501905; IND; DA. 1980; VOL. 89; NO 1; PP. 115-116; BIBL. 2 REF.Article

PARTICULARITES DE SEUIL DANS LES SYSTEMES GUIDES D'ONDEAJVAZYAN YU M.1979; IZVEST. VYSSH. UCHEBN. ZAVED., RADIOFIZ.; SUN; DA. 1979; VOL. 22; NO 6; PP. 750-753; ABS. ENG; BIBL. 5 REF.Article

Generalized mixed-mode S-parametersFERRERO, Andrea; PIROLA, Marco.IEEE transactions on microwave theory and techniques. 2006, Vol 54, Num 1, pp 458-463, issn 0018-9480, 6 p.Article

LARGE-SCALE S PARAMETERS HELP ANALYZE STABILITYFROST RJ.1980; ELECTRON. DESIGN; USA; DA. 1980; VOL. 28; NO 11; PP. 93-98Article

SIMPLE S-PARAMETER MEASUREMENT OF BASE SPREADING RESISTANCEUNWIN RT; KNOTT KF.1980; MICROELECTRONICS; ISSN 0026-2692; GBR; DA. 1980; VOL. 11; NO 6; PP. 18-20; BIBL. 4 REF.Article

MESSUNG DER S-PARAMETER VON MIKROWELLENTRANSISTOREN IN STREIFENLEITER-GEHAEUSEAUS-FUEHRUNG = MESURE DES PARAMETRES S DES TRANSISTORS A MICRO-ONDES EN MONTAGE MICROSTRIBENEDIX A.1978; NACHR.-TECH., ELEKTRON.; DDR; DA. 1978; VOL. 28; NO 3; PP. 116-119; BIBL. 8 REF.Article

A load-pull technique for the determination of transistor S parameters under large-signal conditionsOSBORNE, M. A; MORGAN, G. B.IEE proceedings. Part H, Microwaves, antennas and propagation. 1985, Vol 132, Num 7, pp 419-423Article

Passivity Check of S-Parameter Descriptor Systems via S-Parameter Generalized Hamiltonian MethodsZHENG ZHANG; WONG, Ngai.IEEE transactions on advanced packaging. 2010, Vol 33, Num 4, pp 1034-1042, issn 1521-3323, 9 p.Article

MEASURED MUTUAL COUPLING BETWEEN MICROSTRIP ANTENNASJEDLICKA RP; POE MT; CARVER KR et al.1981; I.E.E.E. TRANS. ANTENNAS PROPAG.; ISSN 0018-926X; USA; DA. 1981; VOL. 29; NO 1; PP. 147-149; BIBL. 12 REF.Article

ZUR ANWENDUNG DER S-PARAMETER THEORIE BEI DER ENTWICKLUNG VON FREQUENZUMSETZERN = APPLICATION DE LA THEORIE DES PARAMETRES S POUR LE DEVELOPPEMENT DES CONVERTISSEURS DE FREQUENCESMUELLER FE.1980; FREQUENZ; DEU; DA. 1980; VOL. 34; NO 4; PP. 99-103; ABS. ENG; BIBL. 3 REF.Article

COMPUTER AIDED CHARACTERIZATION OF BIPOLAR TRANSISTOR FOR CAD APPLICATIONSANTOGNETTI P; BERRINI A; VALLINI P et al.1979; ALTA FREQ.; ITA; DA. 1979; VOL. 48; NO 7; PP. 420-424; BIBL. 6 REF.Article

AN EASILY IMPLEMENTABLE NETWORK ANALYZER.WATANABE K; ASHIKI M.1977; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1977; VOL. 26; NO 4; PP. 309-312; BIBL. 7 REF.Article

"TWO-SIGNAL" METHOD OF MEASURING THE LARGE-SIGNAL S-PARAMETERS OF TRANSISTORSMAZUMDER SR; VAN DER PUIJE PD.1978; I.E.E.E. TRANS. MICROWAVE THEORY TECH.; USA; DA. 1978; VOL. 26; NO 6; PP. 417-420; BIBL. 11 REF.Article

THE USE OF TIME-DOMAIN TECHNIQUES OF MICROWAVE TRANSISTOR S-PARAMETER MEASUREMENTS.LOEB HW; WARD PJ.1977; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1977; VOL. 26; NO 4; PP. 383-388; BIBL. 9 REF.Article

THE APPLICATION OF AN ON-LINE COMPUTER TO MICROWAVE MEASUREMENT.SHURMER HV; LUXTON HEG; HOSSEINI NM et al.1976; IN: IMEKO VII. PRACT. MEAS. IMPROV. EFFIC. CONGR. PREPR.; LONDON; 1976; S.L.; INT. MEAS. CONFED.; DA. 1976; VOL. 2; PP. BEL/211.1-BEL/211.10; BIBL. 7 REF.Conference Paper

Extended S-Parameter Method Including Radiation Pattern Measurements of an AntennaFUKASAWA, Toru; YANAGI, Takashi; MIYASHITA, Hiroaki et al.IEEE transactions on antennas and propagation. 2012, Vol 60, Num 12, pp 5645-5653, issn 0018-926X, 9 p.Article

Do we understand the ηN interaction from the near-threshold η photoproduction on the deuteron?FIX, A; ARENHÖVEL, H.The European physical journal. A, Hadrons and nuclei. 2004, Vol 19, Num 2, pp 275-282, 8 p.Article

S-PARAMETER MODEL OF DUAL-GATE GAAS MESFETASHOKA H; TUCKER RS.1983; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1983; VOL. 19; NO 2; PP. 39-40; BIBL. 2 REF.Article

REFLECTANCES AND TRANSMITTANCES OF MICROWAVE RESONATORSGALWAS BA.1978; BULL. ACAD. POLON. SCI., SCI. TECH.; POL; DA. 1978; VOL. 26; NO 7; PP. 111-117; ABS. RUS; BIBL. 7 REF.Article

NEW FLOWGRAPH MODE AND CALIBRATION PROCEDURE FOR S-PARAMETER MEASUREMENTS OF DEVICES MOUNTED IN MICROSTRIP FIXTURESHEN YOU WANG; SHOU LION ZOUH.1983; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1983; VOL. 19; NO 5; PP. 171-173; BIBL. 10 REF.Article

FIELD THEORY ANALYSIS AND NUMERICAL SYNTHESIS OF SYMMETRICAL MULTIPLE-BRANCH WAVEGUIDE COUPLERSARNDT F; ELLERMAN D; HAEUSLER HW et al.1982; FREQUENZ; ISSN 0016-1136; DEU; DA. 1982; VOL. 36; NO 10; PP. 262-266; ABS. GER; BIBL. 12 REF.Article

TRANSMISSION PROPERTIES OF SYMMETRICAL WAVEGUIDE Y-JUNCTIONS AND 120^O BENDSKIRSCHNING M; ROEBBERS EJ.1981; AEUE, ARCH. ELEKTRON. UEBERTRAGUNGSTECH.; ISSN 0001-1096; DEU; DA. 1981; VOL. 35; NO 1; PP. 51-53; ABS. GER; BIBL. 5 REF.Article

CHARACTERISATION OF COAXIAL-TO-MICROSTRIP CONNECTOR SUITABLE FOR EVALUATION OF MICROSTRIP 2-PORTS.AJOSE SO; MATHEWS NA; AITCHISON CS et al.1976; ELECTRON. LETTERS; G.B.; DA. 1976; VOL. 12; NO 17; PP. 430-431; BIBL. 6 REF.Article

MEASURING CAPACITOR LOSS.LAFFERTY RE.1976; ELECTRON. DESIGN; U.S.A.; DA. 1976; VOL. 24; NO 24; PP. 130-133; BIBL. 4 REF.Article

A new method to extract carrier velocity in sub-0.1-μm MOSFETs using RF measurementsLEE, Seonghearn.IEEE transactions on nanotechnology. 2006, Vol 5, Num 3, pp 163-166, issn 1536-125X, 4 p.Conference Paper